Характеристики
- Грузоподъёмность
- нет данных
- Вылет
- нет данных
- Повторяемость позиционирования
- нет данных
- Масса
- нет данных
- Степень защиты
- нет данных
Характеристики из источника
Строки приведены так, как их печатает производитель: без перевода, пересчёта и сравнения.
- Gain Linearity
- < 0.01 %
- Internal Shunt Resistor
- 100 kΩ software selectable to SNS+ or SNS- and In+ or In-
- Internal Bridge Completion
- ¼ bridge 120 Ω and 350 Ω
- Sense Drift
- Typical 10 μV/K + 10 ppm of reading/K, max 20 μV/K + 20 ppm of reading/K
- Offset Drift
- Typical 0.03 μV/K + 2.5 ppm of range/K, max 0.1 μV/K + 9 ppm of range/K
- Slice Dimensions
- 136.75 x 115.0 x 35.0 mm
- Number of channels
- 8
- Sense Accuracy
- ±0.02 % of reading ±0.25 mV
- ADC Type
- 24-bit oversampled sigma-delta with anti-aliasing filter
- Ranges
- 2 mV/V ... 1000 mV/V free programmable (software ranges)
- Shunt Resistor Accuracy
- 0.05 %; TCR: 10 ppm/K (others on request)
- Bridge Connection Types
- full bridge strain, ½ bridge strain, ¼ bridge strain (3-wire)
- Slice Dimensions
- 128.4 x 118.4 x 30.14 mm
- Bridge Completion Accuracy
- ±125 µV/V, TCR: 5 ppm/K (others on request)
- Input type
- Full / half / quarter bridge strain (3-wire), Potentiometer
- Excitation Voltage
- Unipolar: 1 V, 2 V, 5 V (see 2)
- Alias Rejection
- -105 dB (all sample rates)
- Power supply
- 9 - 48 V DC
- Delay Through ADC
- 34 / fs
- Input Impedance
- >10 MΩ
- Current Limit
- 42 mA
- Oversampling
- 128
- Gain Drift
- Typical 10 ppm/K (max. 20 ppm/K)
- Excitation Accuracy
- ±3 % of set ±50 mV
Источники
- IOLITE® R12
страница товара; от производителя; издатель: DEWESoft LLC; редакция: 2026-10-02
Где в источнике: Gain Linearity; Internal Shunt Resistor; Internal Bridge Completion; Sense Drift; Offset Drift; Slice Dimensions; Number of channels; Sense Accuracy; ADC Type; Ranges; Shunt Resistor Accuracy; Bridge Connection Types; Bridge Completion Accuracy; Input type; Excitation Voltage; Alias Rejection; Power supply; Delay Through ADC; Input Impedance; Current Limit; Oversampling; Gain Drift; Excitation Accuracy